電流: 250mA-600A

< Characteristics >
Complete Solution
Very compact
Pulsed testing only
Maximum currents: 250mA up to 600A
Maximum number of current steps: 4000
Interface: USB
Rise time: 50ns (F-version); 500ns (L-version);
1µs (XL-version)
Throughput: typically 1s per device

< Description >
The LIV100 is a short pulse test system for the characterization of laser diodes and LEDs at the chip, bar or submount level. The fast rise time with essentially no overshoot allows testing these thermally “naked” devices without undue thermal loading. The standard instruments are not capable of CW testing. We offer three versions of the LIV100 differing in speed and pulse length. Each version is available in any given maximum current (denoted by “xxx” in the list below).

・LIV100-Fxxx: fast version with 50ns rise time and pulse durations from 150ns.
　The longest pulse length at maximum current is typically limited to 10µs.
・LIV100-Lxxx: long pulse version with rise time of 500ns. The shortest pulse duration is 2µs.
　The longest pulse length at maximum current is typically limited to 100µs.
・LIV100-XLxxx: extra long pulse version with rise time of 1µs. The shortest pulse duration is 5µs.
　The longest pulse length at maximum current is 2000µs.

PRINCIPLES OF OPPERATION:
All three systems are controlled via a USB port for automated liv measurements. A parameter set is uploaded from the control computer. Following the start command, the LIVs then perform the complete measurement sequence fully autonomously. The fast data acquisition provides for high throughput.
The LIV100 operates in pulsed mode only:

Pulsed LIV mode:
The burst mode is used to run the driver at constant current with a single pulse (or step) width and pulse separation during the whole burst. The laser power is measured for each pulse in this mode. Schematically this appears as follows:

Pulsed burst mode:
The burst mode is useful for checking the thermal contact on a device or for generating light for a certain length of time for other measurements such as smile, near field / far field patterns or spectra. Artifex Engineering supports this laser diode characterization system with a custom strip line or contact card configuration service.

< Applications >
Applications include laser diode characterization before and after submounting or packaging, inspection of incoming goods and for OEMs. The software delivered with the unit allows for one-click generation of a full pdf data sheet for the device under test. The short pulse capability of the laser diode characterization system LIV100 ensures that the device under test can be measured with negligible thermal loading. This fact can be exploited to determine the thermal resistance of the contact to a submount or package (see the “Tutorial” and “Downloads” tab).